 Home > Biochemistry News > Biotechnology News > The new generation of LVEM 25E low-voltage electron microscope takes only 2 minutes to change samples

The new generation of LVEM 25E low-voltage electron microscope takes only 2 minutes to change samples

 Last Update: 2022-09-14
 Source: Internet
 Author: User

Tags

mhw light crystal

all dry

Search more information of high quality chemicals, good prices and reliable suppliers, visit www.echemi.com

The new generation of LVEM 25E low-voltage electron microscopes

It has energy dispersion spectroscopy (EDS) function

All In One:

Has TEM, STEM, SEM, EDS and ED modes

Simple operation

Quick sample change, only 2 minutes to change samples

No cooling water is required

No need for a specialized laboratory

Ultra-low maintenance costs

The lvem 25E is a new generation of low-voltage electron microscopes

LVEM 25E

Recently, Delong has developed a new generation of LVEM 25E low-voltage electron microscope, which is equipped with five imaging and analysis modes of TEM, STEM, SEM, EDS and ED, taking material characterization research to new heights

The LVEM 25E can not only measure the internal and external structure, but also analyze the chemical composition of the sample, all in one device

There are five imaging modes for one instrument

☛ Equipped with TEM, STEM, SEM, EDS and ED modes

☛ Easily switch imaging modes via intuitive software

☛ Brightfield and darkfield measurements in TEM and STEM modes

☛ SEM mode (BSE) is used for surface measurements

☛ Energy dispersion spectroscopy (EDS) is used for elemental analysis

☛ Electron diffraction (ED) is used to understand crystal structure

Fully integrated and compact design

☛ Compact and space-saving design

☛ Single plug installation is possible in almost any lab environment

☛ There are no special facility requirements (no cooling, power supply, or vibration isolation required

High contrast and resolution for standard samples

☛ Excellent contrast for biological and light material samples

☛ No staining required

☛ Image resolution up to 1.

☛ Designed for conventionally prepared samples

☛ Ultra-fast sample switching

All-in-one design – compact and lightweight

The completely independent design allows for no restrictions on the choice of installation location, truly enabling easy relocation

No special facilities - no worries about installation

The LVEM 25E can be easily installed in most laboratories without the need for special electrical or plumbing considerations

Permanent magnet lenses - no cooling required

The unique LVEM platform uses permanent magnet lenses, making the device compact, rugged and easy to use, while not requiring any cooling

Quick and easy vacuum recovery - automatic soft baking and gun adjustment

In the event of vacuum loss, the LVEM 25E reduces downtime

This function allows the user to measure the irradiance of

The lvem 25E's barrel alignment position is automatically adjusted and controlled by software, eliminating the need for manual correction by the

The vacuum system uses an integrated, maintenance-free turbomolecular pump, combined with a vibration-free ion pump design, which enables ultra-fast sample switching, resulting in an ultra-high vacuum imaging environment, free from contamination

The 25kV Schottky field-launch electron gun has a very high brightness and spatial consistency, allowing for a strong interaction

The LVEM 25E is equipped with TEM, STEM, SEM, ED and ED modes, providing users with a unique choice


TEM	STEM	Dark Feild
High frame rate imaging is provided in 25 kV TEM mode for good contrasting size, shape, and structure measurements .	At lower acceleration voltages, imaging in 10 kV and 15 kV STEM modes provides higher contrast and allows for the analysis of thicker samples .	Both TEM and STEM Darkfield Mode (HAADF) make samples easier to image in challenging backgrounds, crystal planes, dislocations, DNA, and more.

SEM	ED	EDS
SEM mode (BSE) provides analysis of the sample surface to understand the surface shape and texture .	Electron diffraction can structurally characterize crystalline materials.	The EDS mode allows analysis of the chemical composition of the sample and the creation of elemental composition diagrams that can be superimposed with STEM and SEM data.

This article is an English version of an article which is originally in the Chinese language on echemi.com and is provided for information purposes only. This website makes no representation or warranty of any kind, either expressed or implied, as to the accuracy, completeness ownership or reliability of the article or any translations thereof. If you have any concerns or complaints relating to the article, please send an email, providing a detailed description of the concern or complaint, to service@echemi.com. A staff member will contact you within 5 working days. Once verified, infringing content will be removed immediately.