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    Home > Chemicals Industry > China Chemical > The International SIMS (Secondary Ion Mass Spectrometry) Conference will be held in Guangzhou in 2026

    The International SIMS (Secondary Ion Mass Spectrometry) Conference will be held in Guangzhou in 2026

    • Last Update: 2023-01-04
    • Source: Internet
    • Author: User
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    Recently, the Hong Kong University of Science and Technology (Guangzhou) reported that Guangzhou, China has been approved by the Organizing Committee of Secondary Ion Mass Spectrometry (SIMS) to hold the 2026 International SIMS Conference, which will be held
    at the Hong Kong University of Science and Technology (Guangzhou) for the first time.
    The Organizing Committee of the 2026 International SIMS Conference will be Chairman of the Organizing Committee of the International SIM Conference by Lutao Weng, Director of the Center for Materials Characterization and Preparation of the Hong Kong University of Science and Technology (Guangzhou) and Adjunct Professor of the Advanced Materials Domain
    .

     
    SIMS stands for "secondary ion mass spectroscopy
    .
    " It is reported that the international SIMS conference is held every two years and is the top academic conference
    in the field of SIMS.
    According to the convention, it is held in rotation by countries in North America, Europe and Asia, and the 2026 International SIMS Conference will be held in Guangzhou, China, which will be the first time that the conference will be held in China, and China has also become the third Asian country to host the conference, and the Asia that has previously hosted the conference is Japan and South Korea
    .

     
    It is understood that SIMS (secondary ion mass spectrometry) is a highly "crossed" analysis technology, is currently the most advanced micro-area analysis method, but also one of the most widely used surface analysis technology, in materials, biology, earth science, astrochemistry, semiconductor industry and other fields play a very important role
    .

     
    Secondary ion mass spectrometer, also known as ion probe, has high resolution, high precision, high sensitivity and other characteristics, very sensitive, it is through the high energy of the primary ion beam bombardment of the sample surface, so that the molecules on the sample surface absorb energy and sputtering from the surface to produce secondary particles, through the mass analyzer collection, analysis of these secondary ions, you can get a map
    of the sample surface information.

     
    Although SIMS technology started relatively late in China, it has developed rapidly in the past ten years, and the number of instruments and related academic research levels in academia and industry have been continuously growing and improving, and have also been internationally recognized
    .
    Over the years, Professor Weng Lutao has been committed to developing the application of SIMS technology in China, and as the only Chinese representative in the international SIMS organizing committee, he has also actively promoted in-depth exchanges
    between China and the international SIMS field.

     
    Hara: First time in China! The International SIMS (Secondary Ion Mass Spectrometry) Conference will be held in Guangzhou in 2026
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