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Through the development of in situ XPS instrument functions, Beijing Research Institute of Chemical Industry has recently established an in-situ XPS program temperature rise characterization method to realize the simulation and real-time characterization
of the reaction process.
This method solves the technical problem of real-time observation of the valence state of various metal elements, and provides technical support
for improving the process.
In its daily work, the BAI often receives samples
containing a variety of variable valence metal elements.
Due to the different processing technology, its performance often shows great differences
.
If the ex situ characterization method is used, only the highest valence oxidation state
of the metal element can be observed.
After using the in situ XPS program temperature characterization method, the temperature change rate, constant time and number of cycles during the sample characterization process can be controlled, and multiple and segmented program heating experiments of the sample can be carried out, so that the metal elements in the metal elements undergo redox reactions
one by one according to the order.
(Chemical)
